X-Scan F

High-resolution line cameras for accurate and fast-paced quality inspection, and the grading and sorting of raw materials.

Efficient material separation by dual energy and optimized sensors.

Accurate object detection by extremely fast and sensitive scintillator materials.

Enhanced multi-view systems supported with a single controller unit.

Modular, easily scalable.

Optimized detector structure for target applications.

Possibility to balance resolution and contrast by pixel binning function.

Various detector lengths.

Enables large object inspection with a single unit.

Fast scanning speed, up to 8 m/s belt speed.

Robust data transmission and fast synchronization between detector units and a system computer.

Enhanced diagnostic functions.

Key features

  • Single and dual energy options
  • X-ray energy range: 40-225 kVp
  • Pixel pitches from 0.4 to 1.5 millimeters
  • Active area lengths: from 307 up to 1,638mm
  • Dynamic range >16 000:1
  • Gigabit Ethernet interface
  • Diagnostic functions
  • Easy software design based on DT X-View2 software and development kit for Windows and Linux


  • Agriculture
  • Food industry
  • Forest industry
  • Industrial process control
  • Mining
  • Pharmaceutical industry
  • Recycling and waste sorting

X-Scan F series is a product family of high-resolution X-ray linear array detectors designed for accurate and fast-paced quality inspection, and the grading and sorting of raw materials. X-Scan F series minimizes the waste of materials and money, and reduces the throughput time especially in the recycling, mining, sawmilling and food processing industries.

X-Scan F enables the superior material separation capability with a dual energy imaging functionality and optimized sensors. The series comes with a single controller unit supporting enhanced multi-view systems. The series utilizes extremely fast and sensitive scintillator materials providing the most accurate object detection. A pixel binning function embedded in the linear array detectors also makes it possible to balance the resolution and contrast of X-ray images.

The plug-and-play type X-Scan F series is built on a modular platform making it easily scalable to various system configurations. Several different detector lengths are also available allowing the inspection of large-scale objects with a single line camera. The X-Scan F series is based on a new generation digital platform providing over two times faster scanning speeds and quick data synchronization between the detector unit and a system computer. The series has a Gigabit Ethernet interface and enhanced diagnostic functions.