X-Scan F series is a product family of high-resolution X-ray linear array detectors designed for accurate and fast-paced quality inspection, and the grading and sorting of raw materials. X-Scan F series minimizes the waste of materials and money, and reduces the throughput time especially in the recycling, mining, sawmilling and food processing industries.
X-Scan F enables the superior material separation capability with a dual energy imaging functionality and optimized sensors. The series comes with a single controller unit supporting enhanced multi-view systems. The series utilizes extremely fast and sensitive scintillator materials providing the most accurate object detection. A pixel binning function embedded in the linear array detectors also makes it possible to balance the resolution and contrast of X-ray images.
The plug-and-play type X-Scan F series is built on a modular platform making it easily scalable to various system configurations. Several different detector lengths are also available allowing the inspection of large-scale objects with a single line camera. The X-Scan F series is based on a new generation digital platform providing over two times faster scanning speeds and quick data synchronization between the detector unit and a system computer. The series has a Gigabit Ethernet interface and enhanced diagnostic functions.