X-Panel 1412i

Speedy yet sharp CMOS X-ray flat panel detector series optimized for industrial scans.

X-Panel 1412i

The X-Panel 1412i is a CMOS (complementary metal oxide semiconductor) X-ray flat panel detector (FPD) that provides the fastest scanning speed in its class yet razor sharp images, and covers a wide energy range. It is an ideal solution for boosting the imaging performance of industrial CT (computed tomography) and DR (digital radiography) X-ray imaging applications. This use-case-driven detector is built on a proven and robust digital platform to accelerate detector integration to X-ray systems and time-to-market, to extend system lifespan, and to bring greater total cost savings for X-ray OEMs and system integrators.

The speedy yet sharp 1412i utilizes a reliable CMOS imaging sensor (CIS) design for high scanning speeds and image quality, even at low-dose operation modes. The X-Panel 1412i features a frame rate of up to 30 fps in full size and full resolution. In certain application-specific ROI (region of interest) modes, it is also capable of acquiring images at 300 fps. As an example of its key imaging quality parameters, the X-Panel 1412i provides a dynamic range of up to 76 dB.

The X-Panel 1412i has an active area of 140.1-by-120 mm, and robust screen scintillators, which are optimized for fast and high-resolution industrial imaging. It has two gain modes – high gain and high dynamic range modes, and supports both continuous and synchronous triggering modes. It has a pixel size of 100 μm, and is designed for an X-ray energy range of 20-225 kVp.

The X-Panel 1412i is characterized by high X-ray penetration for the inspection of dense objects, and an extended sensor lifetime under X-ray. It is equipped with durable and compact mechanics with multiple installation options for reliability and ease of X-ray imaging system design. The X-Panel 1412i can be easily integrated into small X-ray system form factors, like NDT (non-destructive testing) X-ray cabinets.

The X-Panel 1412i comes with optimized read-out electronics and a reliable Gigabit Ethernet interface. For speeding up design and system integration, a complete developer aid kit is available. The kit includes an application programming interface (API), a panel demonstration application software, necessary cabling, and developer guides.

+Benefits
  • Provides the fastest scanning speed in its class yet razor sharp images at low radiation doses
  • Optimized for static and real-time industrial imaging
  • Supports a wide energy range
  • Features high X-ray penetration
  • Characterized by enhanced radiation hardness
  • Built on a proven and reliable CMOS platform
  • Equipped with durable and compact mechanics with multiple installation options
  • Comes with application-optimized read-out electronics and a developer aid kit
+Key features
  • Active CMOS pixel sensor (APS)
  • Active area 140.1-by-120 mm
    • Dual gain (LFW/HFW) 100 μm pixel
    • 14-bit ADC, full frame rate up to 30 fps, ROI frame rate up to 300 fps
  • Optimized for X-ray energies up to 225 kVp
  • Industrial screen scintillator options
  • Programmable ROI mode
  • Dynamic range up to 76 dB
  • GigE data interface
+Applications
  • Industrial CT (e.g., cone beam CT at additive manufacturing and casting inspection)
  • Industrial DR (e.g., weld and pipeline inspection)
  • Other high-resolution quality inspection and process control applications, for example in the electronics, food, and battery industries
  • Metrology

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