The X-Panel 1615 is an application-optimized CMOS (complementary metal oxide semiconductor) X-ray flat panel detector series designed for surgical and dental X-ray imaging applications. The X-Panel 1615 enhances both patients’ and healthcare professionals’ experience and safety, and eases the design of stringent medical imaging systems for shortening time-to-market and bringing total cost savings.
For greater digital imaging, the X-Panel 1615 is available in two models that are optimized to application-specific requirements, and offer use-case-driven add-on features. The X-Panel 1615s, which features in-built functions for extra image stability in long fluoroscopic scans, is a perfect fit for mini C-arms systems used in the surgical field. In turn, the X-Panel 1615d comes with a capability to scan full frames at record speeds, up to 66 fps, yet the data
transmission is secured through the 1000BASE-T Ethernet. This is made possible by a specific scan-to-buffer mode, which offers completely new scanning options for dental cone beam computed tomography (CBCT) and panoramic imaging.
The X-Panel 1615 models have the largest active area of 161-by-150 mm in its class. This improves diagnosis by enabling full-sized and detailed images of clinically relevant anatomy to be viewed, minimizes the necessary scanning time and as a result the overall radiation dose, and
streamlines workflows during surgical operations and dental treatments.
The detector models are equipped with compact, lightweight mechanics for flexibility and ease of X-ray imaging system design. The X-Panel 1615 can be easily integrated to small X-ray system form factors. In addition, the narrow frames around the active area shrink the shoulder edge distance in
The X-Panel 1615 utilizes a reliable CMOS imaging sensor (CIS) design that sets a new golden standard for high scanning speed and superior image quality, even with ultra-low radiation doses. The solution is powered by a 100-micrometer dual range pixel, and a programmable 14-bit ADC for fast, low noise and high-resolution analog-todigital conversion.
The X-Panel 1615 has an in-built pixel correction functionality that frees up the system resources for actual image construction. For improved image stability, the detector solution has a differential double sampling (DDS) functionality to remove the effects of undesired offset.
For speeding up design and the system integration, a complete developer aid kit is available. The kit includes an application-programming interface (API), demo software, necessary cabling, and developer guides.