Dual Energy X-Card, Security
Detection Technology's X-Card 1.5-32+32DE and X-Card 1.5-64+64DE are dual-energy linear array x-ray detector cards. The cards have two layers of silicon photodiode arrays, targeted for different X-ray energy ranges enabling material discrimination.
Typical applications o DT's dual energy detector cards are security screening systems, where these boards provide excellent raw X-ray image data to be further processed and analyzed. X-Card 1.5-64+64DE can be used for wide range of X-ray energies and flux due to its exceptionally large sensitivity range. Same detector boards can be used to build the core of a small carry-on baggage system or a mid-size cargo or light vehicls inspection system. In typical installation steel penetration exceeds 30 mm and resolution 40 AWG.
X-Card 1.5-32+32DE
- Dual-energy capability
- Number of pixels 32 (LE) + 32 (HE)
- Pixel pitch 1.5 mm
- Low-energy GOS scintillator
- High-energy CsI scintillator
- Minimum line integration time 0.2 ms
- Sensitivity range 1.5 pC-10.5 pC with 7 steps
- Cascadable to form X-ray scanning arrays with X-DAQ data acquisition board
X-Card 1.5-64+64DE
- Dual-energy capability
- High-performance photodiode + ASIC design with advanced packaging technology
- Number of pixels 64 (LE) + 64 (HE), allowing reduced cost per pixel
- Pixel pitch 1.5 mm
- Low-energy GOS scintillator
- High-energy CsI scintillator
- Minimum line integration time 0.2 ms
- Sensitivity range 1.5 pC-76.5 pC with 51 step options (separate settings for LE and HE)
- Cascadable to form X-ray scanning arrays with X-DAQ data acquisition board
